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Signatone XXC5S/LDC2 computer aided probe station
Signatone XXC5S/LDC2 Prober/Probe Station w/CPU Used
Model/Part No:XXC5S/LDC2 Our Item ID: 5722
Manufactures description may not fully describe unit since some units may have custom options. Unit is sold as pictured and only includes items listed in our description.
This probe station is in great condition and includes user manuals and software. The wafer probe workstation was pulled from a working environment. Probing station description: 100mm Chuck Signatone XXC5S/LDC1 Probe Station #XXC5T-A7OEDA (2) Signatone CAP-945 Computer Aided Probes Signatone S-400 Controller Trio-Tech Int'l TC1000 Temp Controller Signatone SA-Zoom Signatone X/Y Axis Controller XXC5T-A70EDA Kinetic System Vibraplane Table Ready Lamp ELC-15 Light Source Viewsonic LCD monitor PC Keyboard
Signatone is pleased to introduce the new XXC semiautomatic probe station designed for use with a Local Chamber (LCD2-XXC). The XXC probe station runs under control of the popular Signatone Solutions Windows software allowing step and repeat or sub-micron resolution movements. The wafer chuck diameter and the wafer stage range of motion is 200mm (8"). Several microscope options are avaialble. The XXC accepts most micropositioners, hot chucks, cold chucks, microwave probes, and other options.
When integrated with the local chamber, a number of benefits are gained. The chamber acts as a light tight shield preventing light into the test area allowing C-V, femto amp level current tests and other light sensitive measurements. The chamber also acts as a shield against RF noise. When probing at temperatures below the dew point, the chamber creates a small environmental chamber allowing a dryer to quickly evacuate moisture and permit probing down to -65 C without frost build up. One of the key benefits includes manual access to position the probes and microscope.
The tasks involved in analyzing a semiconductor device failure include finding the correct lines or nodes to probe, placing probe tips on probing targets, and often, re-locating and re-probing targets on the same unit or another unit. The use of a programmable, intra-device navigation system greatly reduces the time and effort required to perform these tasks and provides greater protection for the device under test.
Signatone's Computer Aided Probing System consists of mechanical and electronic enhancements to either an automatic or manual probe station. The system includes a computer (PC), a proprietary Windows software program, a motorized X-Y microscope stage, a microscope with motorized focus control, Computer Aided Probes, i.e., motorized micropositioners or "CAP" probes and contact sensing hardware. A video system is also normally used. An "on-screen" video system that displays a digitized real-time image of the device-under-test on the computer monitor is another powerful option.
Item Tested?: Partially TestedPhysical Condition: Very Good; Working Condition: N/A (Not Applicable)1500 | 75x 45x70 | 1
