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Probe technology C48-5 ii vo wafer test card 20V8-02


Probe cards are used for testing wafers directly.
A full size probe card, or a combination of a probe card interface board (PIB) with a probe card is installed on the test head and locked down using a mechanical lock ring or screws, depending on the tester type. The test head is inverted, needles down, and the prober is maneuvered in place beneath the test head. The test head is then lowered in place and locked to the prober using a mechanical interface. An electrical connection is also installed from the tester to the prober which permits communication between the equipment.
Card Measures Approx. 4 wide x 7 Long



Probe technology C48-5 ii vo wafer test card 20V8-02 Probe technology C48-5 ii vo wafer test card 20V8-02 Probe technology C48-5 ii vo wafer test card 20V8-02 Probe technology C48-5 ii vo wafer test card 20V8-02